ATE - Automated Test Equipment
Pragma’s ATE systems are strictly tailored onto Customer requirements & specifications. The ATE solutions comprise:
- Mobile systems (field testing),
- Validation racks (laboratory & design testing),
- Product compliance verification (on-line, off-line),
- Huge self-standing ATE (supply & measurement).
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- ATE x UPS: Test Bench for high power UPS testing.
- Application: Industrial witness test for 3F UPS up to 300KVA.
- Performance measurements according to CEI-EN 62040-3
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- ATE x BP: Test Bench for door interlocking devices.
- Application: Industrial device validation and burn-in
- Impulsive and thermal BP testing with climatic control
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- ATE LASET: test bench for high speed digital testing.
- Application: Industrial & Defense 3 level maintenance
- Digital pattern generation and acquisition Go/No go and Failure identification (reverse probing)
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- Custom ATE: Test Bench for military cipher devices.
- Application: Defense device and burn-in
- Multi-UUT testing (#25) with custom protocol and thermal cycles
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- ATE x LEU: Test Bench for Railway’s Line Encoding Unit.
- Application: Railway Transport
- Functional testing with custom stimulation source and custom protocol decoding
- Datasheet
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- ATS x LEU: Test Bench for Railway’s Line Encoding Unit.
- Application: Railway Transport
- Functional testing with custom stimulation source and custom protocol decoding
- Datasheet
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- ATS x UPS: Test Bench for high power UPS testing.
- Application: Industrial witness test for 3F UPS up to 300KVA.
- Performance measurements according to CEI-EN 62040-3
-
- ATS LASET: test bench for high speed digital testing.
- Application: Industrial & Defense 3 level maintenance
- Digital pattern generation and acquisition Go/No go and Failure identification (reverse probing)
-
- ATS x BP: Test Bench for door interlocking devices.
- Application: Industrial device validation and burn-in
- Impulsive and thermal BP testing with climatic control
-
- Custom ATS: Test Bench for military cipher devices.
- Application: Defense device and burn-in
- Multi-UUT testing (#25) with custom protocol and thermal cycles
